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DAC
2006
ACM
14 years 1 months ago
Modeling and analysis of circuit performance of ballistic CNFET
With the advent of carbon nanotube technology, evaluating circuit and system performance using these devices is becoming extremely important. In this paper, we propose a quasi-ana...
Bipul C. Paul, Shinobu Fujita, Masaki Okajima, Tho...
ISLPED
2003
ACM
94views Hardware» more  ISLPED 2003»
14 years 24 days ago
Evolution of low power electronics and its future applications
Low power technology is impacting our society by creating the newly emerging digital consumer market, which leads to the nomadic life-style. In this paper, historical review of th...
Tsugio Makimoto, Yoshio Sakai
ISQED
2009
IEEE
103views Hardware» more  ISQED 2009»
14 years 2 months ago
A systematic approach to modeling and analysis of transient faults in logic circuits
With technology scaling, the occurrence rate of not only single, but also multiple transients resulting from a single hit is increasing. In this work, we consider the effect of th...
Natasa Miskov-Zivanov, Diana Marculescu
ISCA
2009
IEEE
152views Hardware» more  ISCA 2009»
14 years 2 months ago
Scaling the bandwidth wall: challenges in and avenues for CMP scaling
As transistor density continues to grow at an exponential rate in accordance to Moore’s law, the goal for many Chip Multi-Processor (CMP) systems is to scale the number of on-ch...
Brian M. Rogers, Anil Krishna, Gordon B. Bell, Ken...
ET
2002
97views more  ET 2002»
13 years 7 months ago
Test Generation for Crosstalk-Induced Faults: Framework and Computational Results
Due to technology scaling and increasing clock frequency, problems due to noise effects lead to an increase in design/debugging efforts and a decrease in circuit performance. This...
Wei-Yu Chen, Sandeep K. Gupta, Melvin A. Breuer