The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
Sanjay Pant, David Blaauw, Vladimir Zolotov, Savit...
In this paper, we present novel algorithms that effectively combine physical layout and early logic synthesis to improve overall design quality. In addition, we employ partitionin...
Electronic System Level (ESL) design manages the complexity of todays systems by using abstract models. In this context Transaction Level Modeling (TLM) is state-of-theart for desc...
Achieving design closure is one of the biggest headaches for modern VLSI designers. This problem is exacerbated by high-level design automation tools that ignore increasingly impo...
Zhenyu (Peter) Gu, Jia Wang, Robert P. Dick, Hai Z...
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
Sandip Kundu, Piet Engelke, Ilia Polian, Bernd Bec...