Advanced CAD tools and high-density VLSI technologies have combined to create a new market for reusable digital designs. The economic viability of the new core-based design paradig...
John Lach, William H. Mangione-Smith, Miodrag Potk...
With the thermal effect, improper analog placements may degrade circuit performance because the thermal impact from power devices can affect electrical characteristics of the ther...
Po-Hung Lin, Hongbo Zhang, Martin D. F. Wong, Yao-...
Our program benchmarks and simulations of novel circuits indicate that large-window processors are feasible. Using our redesigned superscalar components, a large-window processor ...
Dana S. Henry, Bradley C. Kuszmaul, Gabriel H. Loh...
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
Sayeed A. Badrudduza, Ziyan Wang, Giby Samson, Law...
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...