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DAC
2003
ACM
14 years 3 months ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
JCDL
2009
ACM
121views Education» more  JCDL 2009»
14 years 4 months ago
Improving historical research by linking digital library information to a global genealogical database
Journals, letters, and other writings are of great value to historians and those who research their own family history; however, it can be difficult to find writings by specific...
Douglas J. Kennard, William B. Lund, Bryan S. Mors...
ITC
2003
IEEE
134views Hardware» more  ITC 2003»
14 years 3 months ago
Effectiveness Improvement of ECR Tests
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...
Wanli Jiang, Erik Peterson, Bob Robotka
ITC
1997
IEEE
73views Hardware» more  ITC 1997»
14 years 2 months ago
A Low-Overhead Design for Testability and Test Generation Technique for Core-Based Systems
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...
Indradeep Ghosh, Niraj K. Jha, Sujit Dey
LREC
2008
174views Education» more  LREC 2008»
13 years 11 months ago
Automatic Phoneme Segmentation with Relaxed Textual Constraints
Speech synthesis by unit selection requires the segmentation of a large single speaker high quality recording. Automatic speech recognition techniques, e.g. Hidden Markov Models (...
Pierre Lanchantin, Andrew C. Morris, Xavier Rodet,...