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» Improved Low-Degree Testing and its Applications
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AIA
2007
13 years 10 months ago
Minimizing leakage: What if every gate could have its individual threshold voltage?
Designers aim at fast but low-power consuming integrated circuits. Since high processing speed always comes with high energy demands, the literature provides several ways to reduc...
Ralf Salomon, Frank Sill, Dirk Timmermann
ICSE
2007
IEEE-ACM
14 years 8 months ago
Automated Generation of Context-Aware Tests
The incorporation of context-awareness capabilities into pervasive applications allows them to leverage contextual information to provide additional services while maintaining an ...
Zhimin Wang, Sebastian G. Elbaum, David S. Rosenbl...
DSD
2010
IEEE
144views Hardware» more  DSD 2010»
13 years 8 months ago
On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen
IEEEPACT
2009
IEEE
14 years 3 months ago
StealthTest: Low Overhead Online Software Testing Using Transactional Memory
—Software testing is hard. The emergence of multicore architectures and the proliferation of bugprone multithreaded software makes testing even harder. To this end, researchers h...
Jayaram Bobba, Weiwei Xiong, Luke Yen, Mark D. Hil...
ISSTA
2010
ACM
14 years 9 days ago
Strict control dependence and its effect on dynamic information flow analyses
Program control dependence has substantial impact on applications such as dynamic information flow tracking and data lineage tracing (a technique tracking the set of inputs that ...
Tao Bao, Yunhui Zheng, Zhiqiang Lin, Xiangyu Zhang...