1117 search results - page 12 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
VTS
2003
IEEE
14 years 23 days ago
2003
IEEE
In this paper, an efficient technique for test data volume reduction based on the shared scan-in (Illinois Scan) architecture and the scan chain reconfiguration (Dynamic Scan) arc...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
As the complexity of integrated circuits has increased, so has the need for improving testing efficiency. Unfortunately, the types of defects are also becoming more complex, which...
PVLDB
2008
13 years 7 months ago
2008
Graphs are widely used to model complicated data semantics in many applications. In this paper, we aim to develop efficient techniques to retrieve graphs, containing a given query...
DFT
2006
IEEE
14 years 1 months ago
2006
IEEE
This paper presents a procedure for Synthesis of LINear test pattern Generators called SLING. SLING can synthesize linear test pattern generators that satisfy constraints on area,...
VLSID
2001
IEEE
14 years 7 months ago
2001
IEEE
A technique for signature based diagnosis using windows of different sizes is presented. It allows to obtain increased diagnostic information from a given test at a lower cost, wi...