1117 search results - page 17 / 224 » Improving Testing Efficiency using Cumulative Test Analysis |
SIGDOC
2000
ACM
13 years 12 months ago
2000
ACM
∗ This paper introduces low-tech simulation as a technique for testing procedures and their documentation. The key idea is to test the interface-procedure-documentation set in th...
BMCBI
2007
13 years 7 months ago
2007
Background: Boolean network (BN) modeling is a commonly used method for constructing gene regulatory networks from time series microarray data. However, its major drawback is that...
ATS
1998
IEEE
13 years 11 months ago
1998
IEEE
In mixed-mode BIST, deterministic test patterns are generated with on-chip hardware to detect the random-pattern-resistant (r.p.r.) faults that are missed by the pseudo-random pat...
TC
1998
13 years 7 months ago
1998
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
SIGCSE
2006
ACM
14 years 1 months ago
2006
ACM
New accreditation requirements focus on education as a “continuous improvement process.” The most important part of such a process is that information gets fed back into the s...