Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
Dan Adolfsson, Joanna Siew, Erik Jan Marinissen, E...
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Energy Consumption Ratio (ECR) test, a current-based test, has shown its ability to reduce the impact of process variations and detect hard-to-detect faults. The effectiveness of ...