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DAC
2003
ACM
14 years 22 days ago
Test generation for designs with multiple clocks
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
Xijiang Lin, Rob Thompson
DAC
2008
ACM
14 years 8 months ago
Functional test selection based on unsupervised support vector analysis
Extensive software-based simulation continues to be the mainstream methodology for functional verification of designs. To optimize the use of limited simulation resources, coverag...
Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Fo...
ATS
2009
IEEE
132views Hardware» more  ATS 2009»
14 years 2 months ago
On Improving Diagnostic Test Generation for Scan Chain Failures
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
DAC
2004
ACM
13 years 11 months ago
Probabilistic regression suites for functional verification
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...
Shai Fine, Shmuel Ur, Avi Ziv
KBSE
2009
IEEE
14 years 2 months ago
Reggae: Automated Test Generation for Programs Using Complex Regular Expressions
Abstract—Test coverage such as branch coverage is commonly measured to assess the sufficiency of test inputs. To reduce tedious manual efforts in generating high-covering test i...
Nuo Li, Tao Xie, Nikolai Tillmann, Jonathan de Hal...