46 search results - page 8 / 10 » Incremental Diagnosis and Correction of Multiple Faults and ... |
MOBISYS
2007
ACM
14 years 7 months ago
2007
ACM
Software failures in wireless sensor systems are notoriously difficult to debug. Resource constraints in wireless deployments substantially restrict visibility into the root cause...
HPCA
2006
IEEE
14 years 8 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
BMCBI
2010
13 years 7 months ago
2010
Correction to Chakrabarti S, Lanczycki CJ, Panchenko AR, Przytycka TM, Thiessen PA and Bryant SH: State of the art: refinement of multiple sequence alignments. BMC Bioinformatics ...
DAC
2010
ACM
13 years 11 months ago
2010
ACM
As device size shrinks to the nanometer range, FPGAs are increasingly prone to manufacturing defects. We anticipate that the ability to tolerate multiple defects will be very impo...
SIGMOD
2005
ACM
14 years 7 months ago
2005
ACM
The goal is to monitor multiple numerical streams, and determine which pairs are correlated with lags, as well as the value of each such lag. Lag correlations (and anticorrelation...