The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
This paper presents a two-step, RC-interconnect insensitive linear time-varying (LTV) driver model for gate-level timing calculation. We show how to characterize a driver with the...
— The inductance and coupling effects in interconnects and non-linear receiver loads has resulted in complex input signals and output loads for gates in the modern deep submicron...
We describe a novel method for verifying programs that manipulate linked lists, based on two new predicates that characterize reachability of heap cells. These predicates allow re...
—Packet-switched interconnect fabric is a promising on-chip communication solution for many-core architectures. It offers high throughput and excellent scalability for on-chip da...
Zheng Li, Jie Wu, Li Shang, Robert P. Dick, Yihe S...