1548 search results - page 198 / 310 » Integration of Simulation with Enterprise Models |
151
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ICCAD
2006
IEEE
16 years 26 days ago
2006
IEEE
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
115
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ISLPED
2000
ACM
15 years 8 months ago
2000
ACM
Power is increasingly becoming a design constraint for embedded systems. A processor is responsible for energy consumption on account of the software component of the embedded sys...
130
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ENTCS
2007
15 years 3 months ago
2007
We describe techniques for diagnosing errors in formal equivalence checking of RTL and transistor level models of high performance microprocessors at Freescale Semiconductor Inc. ...
124
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DSD
2009
IEEE
15 years 10 months ago
2009
IEEE
— In this paper, we present a novel framework for the automated generation of Network-on-Chips (NoC) architectures, that enables architecture exploration and optimization. The au...
159
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SLIP
2009
ACM
15 years 10 months ago
2009
ACM
Individual dies in 3D integrated circuits are connected using throughsilicon-vias (TSVs). TSVs not only increase manufacturing cost, but also incur silicon area, delay, and power ...