4 search results - page 1 / 1 » Interconnect delay and slew metrics using the beta distribut... |
DATE
2010
IEEE
14 years 4 months ago
2010
IEEE
—Integrated circuit process technology is entering the ultra deep submicron era. At this level, interconnect structure becomes very stiff and the metal resistance shielding effec...
ISPD
2003
ACM
14 years 4 months ago
2003
ACM
: Recent years have seen significant research in finding closed form expressions for the delay of an RC circuit that improves upon the Elmore delay model. However, several of these...
DATE
2006
IEEE
14 years 4 months ago
2006
IEEE
This paper focuses on statistical interconnect timing analysis in a parameterized block-based statistical static timing analysis tool. In particular, a new framework for performin...
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
We propose a new metric for evaluation of interconnect architectures. This metric is computed by optimal assignment of wires from a given wire length distribution (WLD) to a given...