Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
In order to understand the complex physics of mother nature, physicist often use many approximations to understand one area of physics and then write a simulation to reduce these ...
Norbert Podhorszki, Scott Klasky, Qing Liu, Cipria...
We present a set of techniques and design principles for the visualization of large dynamic software logs consisting of attributed change events, such as obtained from instrumenti...
Gate sizing in VLSI design is a widely-used method for power or area recovery subject to timing constraints. Several previous works have proposed gate sizing heuristics for power ...