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DFT
2005
IEEE
72views VLSI» more  DFT 2005»
14 years 1 months ago
Soft Error Modeling and Protection for Sequential Elements
Sequential elements, flip-flops, latches, and memory cells, are the most vulnerable components to soft errors. Since state-of-the-art designs contain millions of bistables, it i...
Hossein Asadi, Mehdi Baradaran Tahoori
DAC
2003
ACM
14 years 8 months ago
Performance-impact limited area fill synthesis
Chemical-mechanical planarization (CMP) and other manufacturing steps in very deep-submicron VLSI have varying effects on device and interconnect features, depending on the local ...
Yu Chen, Puneet Gupta, Andrew B. Kahng
SC
2009
ACM
14 years 11 days ago
Plasma fusion code coupling using scalable I/O services and scientific workflows
In order to understand the complex physics of mother nature, physicist often use many approximations to understand one area of physics and then write a simulation to reduce these ...
Norbert Podhorszki, Scott Klasky, Qing Liu, Cipria...
VISSYM
2007
13 years 10 months ago
Multiscale Visualization of Dynamic Software Logs
We present a set of techniques and design principles for the visualization of large dynamic software logs consisting of attributed change events, such as obtained from instrumenti...
Sergio Moreta, Alexandru Telea
ISPD
2012
ACM
288views Hardware» more  ISPD 2012»
12 years 3 months ago
Construction of realistic gate sizing benchmarks with known optimal solutions
Gate sizing in VLSI design is a widely-used method for power or area recovery subject to timing constraints. Several previous works have proposed gate sizing heuristics for power ...
Andrew B. Kahng, Seokhyeong Kang