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DATE
2007
IEEE
86views Hardware» more  DATE 2007»
14 years 1 months ago
Reduction of detected acceptable faults for yield improvement via error-tolerance
Error-tolerance is an innovative way to enhance the effective yield of IC products. Previously a test methodology based on error-rate estimation to support error-tolerance was pro...
Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
IROS
2007
IEEE
140views Robotics» more  IROS 2007»
14 years 1 months ago
Test-environment based on a team of miniature walking robots for evaluation of collaborative control methods
— For the collaborative control of a team of robots, a set of well-suited high-level control algorithms, especially for path planning and measurement scheduling, is essential. Th...
Florian Weissel, Marco F. Huber, Uwe D. Hanebeck
IEEECIT
2006
IEEE
14 years 1 months ago
A Trap-based Mechanism for Runtime Kernel Modification
Runtime modification of kernel code is a difficult problem. However, the need of modifiable kernel is increasing because new requirements and services that are unanticipated at th...
Young-Pil Kim, Jin-Hee Choi, Chuck Yoo
TIFS
2008
123views more  TIFS 2008»
13 years 7 months ago
A Region Ensemble for 3-D Face Recognition
In this paper, we introduce a new system for 3-D face recognition based on the fusion of results from a committee of regions that have been independently matched. Experimental resu...
Timothy C. Faltemier, Kevin W. Bowyer, Patrick J. ...
SC
2009
ACM
14 years 2 months ago
Bridging parallel and reconfigurable computing with multilevel PGAS and SHMEM+
Reconfigurable computing (RC) systems based on FPGAs are becoming an increasingly attractive solution to building parallel systems of the future. Applications targeting such syste...
Vikas Aggarwal, Alan D. George, K. Yalamanchili, C...