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DAC
2006
ACM
14 years 9 months ago
MARS-C: modeling and reduction of soft errors in combinational circuits
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
Natasa Miskov-Zivanov, Diana Marculescu
DIALM
2007
ACM
144views Algorithms» more  DIALM 2007»
14 years 23 days ago
Reliable Local Broadcast in a Wireless Network Prone to Byzantine Failures
Reliable broadcast can be a very useful primitive for many distributed applications, especially in the context of sensoractuator networks. Recently, the issue of reliable broadcas...
Vartika Bhandari, Nitin H. Vaidya
HPCA
2006
IEEE
14 years 9 months ago
BulletProof: a defect-tolerant CMP switch architecture
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
ISCAS
2007
IEEE
106views Hardware» more  ISCAS 2007»
14 years 3 months ago
Ensemble Dependent Matrix Methodology for Probabilistic-Based Fault-tolerant Nanoscale Circuit Design
—Two probabilistic-based models, namely the Ensemble-Dependent Matrix model [1][3] and the Markov Random Field model [2], have been proposed to deal with faults in nanoscale syst...
Huifei Rao, Jie Chen, Changhong Yu, Woon Tiong Ang...
ISPA
2004
Springer
14 years 2 months ago
Cayley DHTs - A Group-Theoretic Framework for Analyzing DHTs Based on Cayley Graphs
Static DHT topologies influence important features of such DHTs such as scalability, communication load balancing, routing efficiency and fault tolerance. Nevertheless, it is co...
Changtao Qu, Wolfgang Nejdl, Matthias Kriesell