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ICCAD
2005
IEEE
133views Hardware» more  ICCAD 2005»
14 years 6 months ago
Gate sizing using incremental parameterized statistical timing analysis
— As technology scales into the sub-90nm domain, manufacturing variations become an increasingly significant portion of circuit delay. As a result, delays must be modeled as sta...
Matthew R. Guthaus, Natesan Venkateswaran, Chandu ...
DATE
2009
IEEE
138views Hardware» more  DATE 2009»
14 years 3 months ago
Scalable Adaptive Scan (SAS)
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarch...
Anshuman Chandra, Rohit Kapur, Yasunari Kanzawa
ASPDAC
2009
ACM
142views Hardware» more  ASPDAC 2009»
14 years 3 months ago
On the futility of statistical power optimization
In response to the increasing variations in integrated-circuit manufacturing, the current trend is to create designs that take these variations into account statistically. In this...
Jason Cong, Puneet Gupta, John Lee
CIMCA
2008
IEEE
14 years 3 months ago
Seller's Strategies for Predicting Winning Bid Prices in Online Auctions
Online auctions have become extremely popular in recent years. Ability to predict winning bid prices accurately can help bidders to maximize their profit. This paper proposes a nu...
Yevgeniya Kovalchuk
CSSE
2008
IEEE
14 years 3 months ago
Analysis of the Virtual Enterprise Partner Selection Based on Multi-agent System
: Today, virtual enterprise is regarded as the most competitive management model of enterprises that faces the resource of the globe. This paper proposed an instructor of remote ma...
Zunqi Yang, Hai Lin