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» Leakage power modeling and reduction with data retention
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CHES
2003
Springer
100views Cryptology» more  CHES 2003»
14 years 1 months ago
Multi-channel Attacks
We introduce multi-channel attacks, i.e., side-channel attacks which utilize multiple side-channels such as power and EM simultaneously. We propose an adversarial model which combi...
Dakshi Agrawal, Josyula R. Rao, Pankaj Rohatgi
ETS
2006
IEEE
93views Hardware» more  ETS 2006»
14 years 2 months ago
Retention-Aware Test Scheduling for BISTed Embedded SRAMs
In this paper we address the test scheduling problem for Builtin Self-tested (BISTed) embedded SRAMs (e-SRAMs) when Data Retention Faults (DRFs) are considered. The proposed test ...
Qiang Xu, Baosheng Wang, F. Y. Young
VLSID
2004
IEEE
112views VLSI» more  VLSID 2004»
14 years 9 months ago
Designing Leakage Aware Multipliers
Power consumption has become a major design limiter. With the continued reduction of threshold voltages, optimizing leakage energy consumption is becoming increasingly important. ...
M. DeRenzo, Mary Jane Irwin, Narayanan Vijaykrishn...
ISQED
2008
IEEE
120views Hardware» more  ISQED 2008»
14 years 3 months ago
Error-Tolerant SRAM Design for Ultra-Low Power Standby Operation
We present an error-tolerant SRAM design optimized for ultra-low standby power. Using SRAM cell optimization techniques, the maximum data retention voltage (DRV) of a 90nm 26kb SR...
Huifang Qin, Animesh Kumar, Kannan Ramchandran, Ja...
JCSC
2002
129views more  JCSC 2002»
13 years 8 months ago
Leakage Current Reduction in VLSI Systems
There is a growing need to analyze and optimize the stand-by component of power in digital circuits designed for portable and battery-powered applications. Since these circuits re...
David Blaauw, Steven M. Martin, Trevor N. Mudge, K...