373 search results - page 73 / 75 » Learning Arithmetic Circuits |
ICIP
2010
IEEE
13 years 5 months ago
2010
IEEE
Optical lithography is a critical step in the semiconductor manufacturing process, and one key problem is the design of the photomask for a particular circuit pattern, given the o...
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
The lack of good "correlation" between pre-silicon simulated delays and measured delays on silicon (silicon data) has spurred efforts on so-called silicon debug. The ide...
VLSID
1998
IEEE
13 years 11 months ago
1998
IEEE
With several commercial tools becoming available, the high-level synthesis of applicationspeci c integrated circuits is nding wide spread acceptance in VLSI industry today. Existi...
CCS
2010
ACM
13 years 7 months ago
2010
ACM
We show in this paper how several proposed Physical Unclonable Functions (PUFs) can be broken by numerical modeling attacks. Given a set of challenge-response pairs (CRPs) of a PU...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...