Faults in hardware and software are not totally avoidable not even if the components are carefully designed, implemented and tested. In this paper we present a solution for detecti...
— Delay failures are becoming a dominant failure mechanism in nanometer technologies. Diagnosis of such failures is important to ensure yield and robustness of the design. Howeve...
Faster defect localization is achieved by combining IC simulations and internal measurements. Time resolved photon emission records photons emitted during commutations (current) r...
Romain Desplats, Felix Beaudoin, Philippe Perdu, N...
Probabilistic inference was shown effective in non-deterministic diagnosis of end-to-end service failures. Since exact probabilistic diagnosis is known to be an NP-hard problem, a...
Some recent Petri net-based approaches to fault diagnosis of distributed systems suggest to factor the problem into local diagnoses based on the unfoldings of local views of the sy...