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VTS
2007
IEEE
116views Hardware» more  VTS 2007»
14 years 1 months ago
Case Study: Soft Error Rate Analysis in Storage Systems
Soft errors due to cosmic particles are a growing reliability threat for VLSI systems. In this paper we analyze the soft error vulnerability of FPGAs used in storage systems. Sinc...
Brian Mullins, Hossein Asadi, Mehdi Baradaran Taho...
SIGDOC
2004
ACM
14 years 22 days ago
Changes in scientific articles over two hundred years: a coh-metrix analysis
We analyzed texts from years 1800-2004 from the Philosophical Transactions of the Royal Society of London. Two-thousand-word sections from about 20 articles published at 25-year i...
Michell Bruss, Michael J. Albers, Danielle McNamer...
SLIP
2003
ACM
14 years 16 days ago
Error-correction and crosstalk avoidance in DSM busses
Aggressive process scaling and increasing clock rates have made crosstalk noise an important issue in VLSI design. Switching on adjacent wires on long bus lines can increase delay...
Ketan N. Patel, Igor L. Markov
DATE
2010
IEEE
168views Hardware» more  DATE 2010»
14 years 12 days ago
A new placement algorithm for the mitigation of multiple cell upsets in SRAM-based FPGAs
Modern FPGAs have been designed with advanced integrated circuit techniques that allow high speed and low power performance, joined to reconfiguration capabilities. This makes new...
Luca Sterpone, Niccolò Battezzati
VLSID
2006
IEEE
129views VLSI» more  VLSID 2006»
14 years 7 months ago
A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...