980 search results - page 13 / 196 » Logical Testing |
ICCD
2004
IEEE
14 years 4 months ago
2004
IEEE
This paper introduces a new method for deterministic diagnosis of logic cores. The proposed method is based on onchip decompression and comparison of incompletely specified test ...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
This paper describes two research projects that develop new low-cost techniques for testing devices with multiple high-speed (2 to 5 Gbps) signals. Each project uses commercially ...
DATE
2007
IEEE
14 years 1 months ago
2007
IEEE
1 The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requireme...
ENTCS
2010
13 years 7 months ago
2010
We report on the implementation and experimental analysis of an incremental multi-pass tableau-based procedure `a la Wolper for testing satisfiability in the linear time temporal ...
FLOPS
2008
Springer
13 years 9 months ago
2008
Springer
Abstract. We present a lightweight, automated tool for specificationbased testing of declarative programs written in the functional logic programming language Curry and emphasize t...