980 search results - page 16 / 196 » Logical Testing |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
11 Due to the increasing test data volume needed to test corebased System-on-Chip, several test scheduling techniques minimizing the test application time have been proposed. In co...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
VLSID
2005
IEEE
14 years 7 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ITC
2000
IEEE
13 years 12 months ago
2000
IEEE
A common approachfor large industrial designs is to use logic built-in self-test (LBIST)followed by test data from an external tester. Because the fault coverage with LBIST alone ...
ICCD
1992
IEEE
13 years 11 months ago
1992
IEEE
ct Digital's NVAX high-performance microprocessor has a complex logical design. A rigorous simulation-based verification effort was undertaken to ensure that there were no log...