980 search results - page 18 / 196 » Logical Testing |
ICCAD
2003
IEEE
14 years 24 days ago
2003
IEEE
Domino circuits have been used in most modern high-performance microprocessor designs because of their high speed, low transistor-count and hazard-free operation. However, with te...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
SAC
2009
ACM
14 years 2 months ago
2009
ACM
This paper presents a methodology for interoperability testing based on contextual signatures and passive testing with invariants. The concept of contextual signature offers a fra...
DATE
2004
IEEE
13 years 11 months ago
2004
IEEE
There has been considerable research on quantum dots cellular automata as a new computing scheme in the nano-scale regimes. The basic logic element of this technology is a majorit...
HASE
2007
IEEE
14 years 1 months ago
2007
IEEE
We study recent developments in quantum computing (QC) testing and fault tolerance (FT) techniques and discuss several attempts to formalize quantum logic fault models. We illustr...