980 search results - page 31 / 196 » Logical Testing |
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
ICCAD
2001
IEEE
14 years 4 months ago
2001
IEEE
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
PEPM
2010
ACM
14 years 4 months ago
2010
ACM
PET is a prototype Partial Evaluation-based Test case generation tool for a subset of Java bytecode programs. It performs white-box test generation by means of two consecutive Par...
ICML
2009
IEEE
14 years 8 months ago
2009
IEEE
Standard inductive learning requires that training and test instances come from the same distribution. Transfer learning seeks to remove this restriction. In shallow transfer, tes...
ET
2010
13 years 6 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...