980 search results - page 55 / 196 » Logical Testing |
ITC
2003
IEEE
14 years 28 days ago
2003
IEEE
Abstract: We discuss the development of Built-In SelfTest (BIST) configurations that test all of the programmable logic and interconnect resources in the core of Xilinx 4000E, 4000...
DAC
2005
ACM
14 years 8 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
DFT
2003
IEEE
14 years 28 days ago
2003
IEEE
Test scheduling and Test Access Mechanism (TAM) design are two important tasks in the development of a System-on-Chip (SOC) test solution. Previous test scheduling techniques assu...
ASPDAC
2005
ACM
13 years 9 months ago
2005
ACM
Recent research results have shown that the traditional structural testing for delay and crosstalk faults may result in over-testing due to the non-trivial number of such faults t...
JCNS
2006
13 years 7 months ago
2006
We construct a neuronal network to model the logic of associative conditioning as revealed in experimental results using the terrestrial mollusk Limax maximus. We show, in particul...