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ITC
2000
IEEE
101views Hardware» more  ITC 2000»
14 years 19 days ago
Which concurrent error detection scheme to choose ?
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...
Subhasish Mitra, Edward J. McCluskey
CODES
2008
IEEE
13 years 10 months ago
Model checking SystemC designs using timed automata
SystemC is widely used for modeling and simulation in hardware/software co-design. Due to the lack of a complete formal semantics, it is not possible to verify SystemC designs. In...
Paula Herber, Joachim Fellmuth, Sabine Glesner
ICCAD
2006
IEEE
141views Hardware» more  ICCAD 2006»
14 years 5 months ago
Design optimization for single-event upset robustness using simultaneous dual-VDD and sizing techniques
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
Mihir R. Choudhury, Quming Zhou, Kartik Mohanram
DFT
2008
IEEE
89views VLSI» more  DFT 2008»
14 years 2 months ago
Fabrication Variations and Defect Tolerance for Nanomagnet-Based QCA
Tolerating defects and fabrication variations will be critical in any system made with devices that have nanometer feature sizes. This paper considers how fabrication variations a...
Michael T. Niemier, Michael Crocker, Xiaobo Sharon...
ASPDAC
2005
ACM
87views Hardware» more  ASPDAC 2005»
14 years 1 months ago
Static power minimization in current-mode circuits
-We propose a method involvingselectivesignalgating to minimize power dissipation in current-mode CMOS analog and multiple-valued logic (MVL) circuits employing a stack of current ...
M. S. Bhat, H. S. Jamadagni