89 search results - page 14 / 18 » Low Power Testing of VLSI Circuits: Problems and Solutions |
CDC
2010
IEEE
13 years 2 months ago
2010
IEEE
This paper is concerned with studying how the minimum power loss in a power system is related to its network topology. The existing algorithms in the literature all exploit nonline...
ITC
2003
IEEE
14 years 27 days ago
2003
IEEE
This paper describes a system for performing high precision IDDQ measurement of CMOS ICs having a large peak current during operation. Although the measurement rate is at a low sp...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
High efficiency low voltage DC-DC conversion is a key enabler to the design of power-efficient integrated circuits. Typically a star configuration of the DC-DC converters, where o...
IJAIT
2010
13 years 6 months ago
2010
Many real world industrial applications involve finding a Hamiltonian path with minimum cost. Some instances that belong to this category are transportation routing problem, scan c...
VLSID
1998
IEEE
13 years 12 months ago
1998
IEEE
With several commercial tools becoming available, the high-level synthesis of applicationspeci c integrated circuits is nding wide spread acceptance in VLSI industry today. Existi...