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» Low Power Testing of VLSI Circuits: Problems and Solutions
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VLSID
2002
IEEE
207views VLSI» more  VLSID 2002»
16 years 6 months ago
Synthesis of High Performance Low Power Dynamic CMOS Circuits
This paper presents a novel approach for the synthesis of dynamic CMOS circuits using Domino and Nora styles. As these logic styles can implement only non-inverting logic, convent...
Debasis Samanta, Nishant Sinha, Ajit Pal
ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
15 years 11 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
ISCAS
2006
IEEE
144views Hardware» more  ISCAS 2006»
15 years 11 months ago
A VLSI spike-driven dynamic synapse which learns only when necessary
— We describe an analog VLSI circuit implementing spike-driven synaptic plasticity, embedded in a network of integrate-and-fire neurons. This biologically inspired synapse is hi...
S. Mitra, Stefano Fusi, Giacomo Indiveri
DFT
2004
IEEE
93views VLSI» more  DFT 2004»
15 years 9 months ago
First Level Hold: A Novel Low-Overhead Delay Fault Testing Technique
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
ARVLSI
1995
IEEE
220views VLSI» more  ARVLSI 1995»
15 years 9 months ago
Optimization of combinational and sequential logic circuits for low power using precomputation
Precomputation is a recently proposed logic optimization technique which selectively disables the inputs of a sequential logic circuit, thereby reducing switching activity and pow...
José Monteiro, John Rinderknecht, Srinivas ...