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» Low Power Testing of VLSI Circuits: Problems and Solutions
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VLSID
2002
IEEE
207views VLSI» more  VLSID 2002»
14 years 8 months ago
Synthesis of High Performance Low Power Dynamic CMOS Circuits
This paper presents a novel approach for the synthesis of dynamic CMOS circuits using Domino and Nora styles. As these logic styles can implement only non-inverting logic, convent...
Debasis Samanta, Nishant Sinha, Ajit Pal
ISQED
2006
IEEE
107views Hardware» more  ISQED 2006»
14 years 1 months ago
On Optimizing Scan Testing Power and Routing Cost in Scan Chain Design
— With advanced VLSI manufacturing technology in deep submicron (DSM) regime, we can integrate entire electronic systems on a single chip (SoC). Due to the complexity in SoC desi...
Li-Chung Hsu, Hung-Ming Chen
ISCAS
2006
IEEE
144views Hardware» more  ISCAS 2006»
14 years 1 months ago
A VLSI spike-driven dynamic synapse which learns only when necessary
— We describe an analog VLSI circuit implementing spike-driven synaptic plasticity, embedded in a network of integrate-and-fire neurons. This biologically inspired synapse is hi...
S. Mitra, Stefano Fusi, Giacomo Indiveri
DFT
2004
IEEE
93views VLSI» more  DFT 2004»
13 years 11 months ago
First Level Hold: A Novel Low-Overhead Delay Fault Testing Technique
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
ARVLSI
1995
IEEE
220views VLSI» more  ARVLSI 1995»
13 years 11 months ago
Optimization of combinational and sequential logic circuits for low power using precomputation
Precomputation is a recently proposed logic optimization technique which selectively disables the inputs of a sequential logic circuit, thereby reducing switching activity and pow...
José Monteiro, John Rinderknecht, Srinivas ...