89 search results - page 9 / 18 » Low Power Testing of VLSI Circuits: Problems and Solutions |
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
TVLSI
1998
13 years 7 months ago
1998
— Excessive instantaneous power consumption may reduce the reliability and performance of VLSI chips. Hence, to synthesize circuits with high reliability, it is imperative to ef...
DAC
2002
ACM
14 years 8 months ago
2002
ACM
Reducing power dissipation is one of the most principle subjects in VLSI design today. Scaling causes subthreshold leakage currents to become a large component of total power diss...
GLVLSI
2006
IEEE
14 years 1 months ago
2006
IEEE
As CMOS devices and operating voltages are scaled down, noise and defective devices will impact the reliability of digital circuits. Probabilistic computing compatible with CMOS o...
GLVLSI
2003
IEEE
14 years 27 days ago
2003
IEEE
The current trends in high performance integrated circuits are towards faster and more powerful circuits in the giga-hertz range and even further. As the more complex Integrated C...