224 search results - page 40 / 45 » Low power and high performance design challenges in future t... |
ET
2002
13 years 7 months ago
2002
LVDS is the acronym for Low-Voltage-DifferentialSignaling and is described in both the ANSI/TIA/EIA644 and IEEE 1596.3 standards. High performance yet Low Power and EMI have made ...
TPDS
2010
13 years 5 months ago
2010
Abstract—A rising horizon in chip fabrication is the 3D integration technology. It stacks two or more dies vertically with a dense, highspeed interface to increase the device den...
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
Heavyweight security analysis systems, such as taint analysis and dynamic type checking, are powerful technologies used to detect security vulnerabilities and software bugs. Tradi...
DATE
2010
IEEE
14 years 15 days ago
2010
IEEE
—With every process generation, the problem of variability in physical parameters and environmental conditions poses a great challenge to the design of fast and reliable circuits...
TC
2011
13 years 2 months ago
2011
—CMOS scaling has long been a source of dramatic performance gains. However, semiconductor feature size reduction has resulted in increasing levels of operating temperatures and ...