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» Macromodeling of analog circuits for hierarchical circuit de...
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DDECS
2007
IEEE
105views Hardware» more  DDECS 2007»
14 years 1 months ago
Layout to Logic Defect Analysis for Hierarchical Test Generation
- As shown by previous studies, shorts between the interconnect wires should be considered as the predominant cause of failures in CMOS circuits. Fault models and tools for targeti...
Maksim Jenihhin, Jaan Raik, Raimund Ubar, Witold A...
DAC
2004
ACM
14 years 8 months ago
Sparse transformations and preconditioners for hierarchical 3-D capacitance extraction with multiple dielectrics
Capacitance extraction is an important problem that has been extensively studied. This paper presents a significant improvement for the fast multipole accelerated boundary element...
Shu Yan, Vivek Sarin, Weiping Shi
VLSID
2004
IEEE
114views VLSI» more  VLSID 2004»
14 years 7 months ago
High-Speed Optoelectronics Receivers in SiGe
This paper focuses on the investigation of integrated CMOS and Silicon/Germanium (SiGe) devices for highspeed optical receiver circuits. In this paper, we present several competit...
Amit Gupta, Steven P. Levitan, Leo Selavo, Donald ...
ISCAS
2003
IEEE
107views Hardware» more  ISCAS 2003»
14 years 20 days ago
On chip Gaussian processing for high resolution CMOS image sensors
Spatial image processing chips, known as silicon retinas, are based on the architecture of vertebrate retina and can be mathematically represented as the Laplacian of Gaussian (LO...
Sri Vinayagamoorthy, Richard Hornsey
TCAD
2008
119views more  TCAD 2008»
13 years 7 months ago
Bridging Fault Test Method With Adaptive Power Management Awareness
Abstract--A key design constraint of circuits used in handheld devices is the power consumption, mainly due to battery life limitations. Adaptive power management (APM) techniques ...
S. Saqib Khursheed, Urban Ingelsson, Paul M. Rosin...