220 search results - page 13 / 44 » Metamorphic Testing and Beyond |
ITC
2003
IEEE
14 years 2 months ago
2003
IEEE
The use of AC coupled interconnects to provide communication paths between devices is increasing. The existing IEEE 1149.1 boundary scan standard [1] (JTAG) has limitations that h...
ICCD
2008
IEEE
14 years 6 months ago
2008
IEEE
— Extreme scaling practices in silicon technology are quickly leading to integrated circuit components with limited reliability, where phenomena such as early-transistor failures...
BMCBI
2004
13 years 9 months ago
2004
Background: Microarray studies in cancer compare expression levels between two or more sample groups on thousands of genes. Data analysis follows a population-level approach (e.g....
CIS
2005
Springer
14 years 3 months ago
2005
Springer
Abstract. Survivability should be considered beyond security for networked information systems, which emphasizes the ability of continuing providing services timely in malicious en...
FPGA
2006
ACM
14 years 1 months ago
2006
ACM
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...