We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
Christian J. Hescott, Drew C. Ness, David J. Lilja
The world is increasingly dependent on critical infrastructures such as the electric power grid, water, gas, and oil transport systems, which are susceptible to cascading failures...
Travis C. Service, Daniel R. Tauritz, William M. S...
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
This paper discusses fault-tolerant techniques for SRAM-based FPGAs. These techniques can be based on circuit level modifications, with obvious modifications in the programmable a...
Fernanda Lima Kastensmidt, Gustavo Neuberger, Luig...
Commercial designs are integrating from 10 to 100 embedded functional and storage blocks in a single system on chip (SoC) currently, and the number is likely to increase significa...