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» Methodologies for Tolerating Cell and Interconnect Faults in...
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ISQED
2007
IEEE
116views Hardware» more  ISQED 2007»
14 years 1 months ago
MEMESTAR: A Simulation Framework for Reliability Evaluation over Multiple Environments
We present a methodology for the simulation of soft errors targeting future nano-technological devices. This approach efficiently scales the failure rate of individual devices ac...
Christian J. Hescott, Drew C. Ness, David J. Lilja
COMPSAC
2007
IEEE
13 years 11 months ago
Infrastructure Hardening: A Competitive Coevolutionary Methodology Inspired by Neo-Darwinian Arms Races
The world is increasingly dependent on critical infrastructures such as the electric power grid, water, gas, and oil transport systems, which are susceptible to cascading failures...
Travis C. Service, Daniel R. Tauritz, William M. S...
ASAP
2005
IEEE
165views Hardware» more  ASAP 2005»
14 years 1 months ago
CONAN - A Design Exploration Framework for Reliable Nano-Electronics
In this paper we introduce a design methodology that allows the system/circuit designer to build reliable systems out of unreliable nano-scale components. The central point of our...
Sorin Cotofana, Alexandre Schmid, Yusuf Leblebici,...
CF
2004
ACM
14 years 1 months ago
Designing and testing fault-tolerant techniques for SRAM-based FPGAs
This paper discusses fault-tolerant techniques for SRAM-based FPGAs. These techniques can be based on circuit level modifications, with obvious modifications in the programmable a...
Fernanda Lima Kastensmidt, Gustavo Neuberger, Luig...
ASAP
2007
IEEE
153views Hardware» more  ASAP 2007»
13 years 7 months ago
Performance Evaluation of Adaptive Routing Algorithms for achieving Fault Tolerance in NoC Fabrics
Commercial designs are integrating from 10 to 100 embedded functional and storage blocks in a single system on chip (SoC) currently, and the number is likely to increase significa...
Haibo Zhu, Partha Pratim Pande, Cristian Grecu