501 search results - page 28 / 101 » Methods for true power minimization |
DAC
2008
ACM
14 years 8 months ago
2008
ACM
An effective technique to save power during scan based test is to switch off unused scan chains. The results obtained with this method strongly depend on the mapping of scan flip-...
GLOBECOM
2008
IEEE
14 years 2 months ago
2008
IEEE
—We consider the problem of joint routing, scheduling and power control in multi-hop wireless networks. We use a linear relation between link capacity and signal to interference ...
ICCAD
2000
IEEE
14 years 2 days ago
2000
IEEE
This paper presents an efficient method for optimizing power/ground (P/G) networks by widening wires and adding decoupling capacitors (decaps). It proposes a structured skeleton t...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
High power consumption not only leads to short battery life for handheld devices, but also causes on-chip thermal and reliability problems in general. As power consumption is prop...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...