As technology advances, more and more issues need to be considered in the placement stage, e.g., wirelength, congestion, timing, coupling. It is very hard to consider all of them ...
As VLSI technology reaches 45nm technology node, leakage power optimization has become a major design challenge. Threshold voltage (vt) assignment has been extensively studied, du...
In many information networks, data items – such as updates in social networks, news flowing through interconnected RSS feeds and blogs, measurements in sensor networks, route u...
Abstract—A general variational framework for image approximation and segmentation is introduced. By using a continuous “line-process” to represent edge boundaries, it is poss...
This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...