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DATE
1998
IEEE
106views Hardware» more  DATE 1998»
14 years 2 months ago
March Tests for Word-Oriented Memories
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
A. J. van de Goor, Issam B. S. Tlili
FUIN
2008
80views more  FUIN 2008»
13 years 9 months ago
External Memory Algorithms for String Problems
In this paper we present external memory algorithms for some string problems. External memory algorithms have been developed in many research areas, as the speed gap between fast ...
Kangho Roh, Maxime Crochemore, Costas S. Iliopoulo...
WMPI
2004
ACM
14 years 3 months ago
An analytical model for software-only main memory compression
Abstract. Many applications with large data spaces that cannot run on a typical workstation (due to page faults) call for techniques to expand the effective memory size. One such t...
Irina Chihaia, Thomas R. Gross
DAC
2008
ACM
14 years 10 months ago
Modeling of failure probability and statistical design of spin-torque transfer magnetic random access memory (STT MRAM) array fo
: Spin-Torque Transfer Magnetic RAM (STT MRAM) is a promising candidate for future universal memory. It combines the desirable attributes of current memory technologies such as SRA...
Jing Li, Charles Augustine, Sayeef S. Salahuddin, ...
DATE
2010
IEEE
202views Hardware» more  DATE 2010»
14 years 2 months ago
FlashPower: A detailed power model for NAND flash memory
Abstract— Flash memory is widely used in consumer electronics products, such as cell-phones and music players, and is increasingly displacing hard disk drives as the primary stor...
Vidyabhushan Mohan, Sudhanva Gurumurthi, Mircea R....