31 search results - page 6 / 7 » Modeling Techniques and Tests for Partial Faults in Memory D... |
HPCA
2006
IEEE
14 years 8 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ADC
2008
Springer
14 years 2 months ago
2008
Springer
This article describes how to implement efficient memory resident path indexes for semi-structured data. Two techniques are introduced, and they are shown to be significantly fas...
ASPLOS
2006
ACM
14 years 1 months ago
2006
ACM
The sustained push toward smaller and smaller technology sizes has reached a point where device reliability has moved to the forefront of concerns for next-generation designs. Sil...
SIGMETRICS
2008
ACM
13 years 7 months ago
2008
ACM
Two schemes proposed to cope with unrecoverable or latent media errors and enhance the reliability of RAID systems are examined. The first scheme is the established, widely used d...
AMOST
2007
ACM
13 years 11 months ago
2007
ACM
Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checker...