170 search results - page 6 / 34 » Modeling and analyzing NBTI in the presence of Process Varia... |
ISQED
2007
IEEE
14 years 1 months ago
2007
IEEE
This paper studies the impact of variability on the noise robustness of logic gates using noise rejection curves (NRCs). NRCs allow noise pulses to be modeled using magnitude-dura...
BMCBI
2010
13 years 7 months ago
2010
Background: Microarray technology allows the simultaneous analysis of thousands of genes within a single experiment. Significance analyses of transcriptomic data ignore the gene d...
CORR
2006
Springer
13 years 7 months ago
2006
Springer
Abstract-- The problem of cooperative fusion in the presence of both Byzantine sensors and misinformed sensors is considered. An information theoretic formulation is used to charac...
ISVLSI
2008
IEEE
14 years 2 months ago
2008
IEEE
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— As Double Patterning Technology (DPT) becomes the only solution for 32-nm lithography process, we need to investigate how DPT affects the performance of a chip. In this paper, ...