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DATE
2006
IEEE
115views Hardware» more  DATE 2006»
14 years 2 months ago
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
FUIN
2007
147views more  FUIN 2007»
13 years 8 months ago
Privacy Preserving Database Generation for Database Application Testing
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
Xintao Wu, Yongge Wang, Songtao Guo, Yuliang Zheng
IDEAS
2005
IEEE
165views Database» more  IDEAS 2005»
14 years 2 months ago
Privacy Aware Data Generation for Testing Database Applications
Testing of database applications is of great importance. A significant issue in database application testing consists in the availability of representative data. In this paper we...
Xintao Wu, Chintan Sanghvi, Yongge Wang, Yuliang Z...
ISSRE
2010
IEEE
13 years 7 months ago
DoDOM: Leveraging DOM Invariants for Web 2.0 Application Robustness Testing
—Web 2.0 applications are increasing in popularity. However, they are also prone to errors because of their dynamic nature. This paper presents DoDOM, an automated system for tes...
Karthik Pattabiraman, Benjamin G. Zorn
VISUALIZATION
2003
IEEE
14 years 1 months ago
Visualizing Industrial CT Volume Data for Nondestructive Testing Applications
This paper describes a set of techniques developed for the visualization of high-resolution volume data generated from industrial computed tomography for nondestructive testing (N...
Runzhen Huang, Kwan-Liu Ma, Patrick S. McCormick, ...