Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
Testing of database applications is of great importance. Although various studies have been conducted to investigate testing techniques for database design, relatively few efforts ...
Testing of database applications is of great importance. A significant issue in database application testing consists in the availability of representative data. In this paper we...
—Web 2.0 applications are increasing in popularity. However, they are also prone to errors because of their dynamic nature. This paper presents DoDOM, an automated system for tes...
This paper describes a set of techniques developed for the visualization of high-resolution volume data generated from industrial computed tomography for nondestructive testing (N...
Runzhen Huang, Kwan-Liu Ma, Patrick S. McCormick, ...