The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or vo...
Udo Sobe, Karl-Heinz Rooch, Andreas Ripp, Michael ...
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
Due to the flexibility and adaptability of human, manual handling work is still very important in industry, especially for assembly and maintenance work. Well-designed work operat...
Liang Ma, Wei Zhang, Huanzhang Fu, Yang Guo, Damie...
This article introduces a new class of constraints for spline variational modeling, which allows more flexible user specification, as a constrained point can ”slide” along a...
Julien Lenoir, Laurent Grisoni, Philippe Meseure, ...
This paper describes a simulation technique for RealTime Hw/Sw systems based on an object executable model. It allows designers to seamlessly estimate and verify their solutions f...