38 search results - page 8 / 8 » Modeling wire delay, area, power, and performance in a simul... |
MICRO
2008
IEEE
14 years 4 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
EENERGY
2010
14 years 2 months ago
2010
As energy-related costs have become a major economical factor for IT infrastructures and data-centers, companies and the research community are being challenged to find better an...
ICCAD
1997
IEEE
14 years 1 months ago
1997
IEEE
The relentless push for high performance in custom digital circuits has led to renewed emphasis on circuit optimization or tuning. The parameters of the optimization are typically...