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» Modelling and Design of VAML
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DAC
2002
ACM
16 years 5 months ago
Can BDDs compete with SAT solvers on bounded model checking?
Gianpiero Cabodi, Paolo Camurati, Stefano Quer
EUROMICRO
2005
IEEE
15 years 10 months ago
Model Interchange Using OMG Standards
Marcus Alanen, Ivan Porres
VTS
2006
IEEE
101views Hardware» more  VTS 2006»
15 years 10 months ago
Design Optimization for Robustness to Single Event Upsets
Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU...
Quming Zhou, Mihir R. Choudhury, Kartik Mohanram