As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
Dinesh Patil, Sunghee Yun, Seung-Jean Kim, Alvin C...
In this paper, a comprehensive and fast method is presented for the timing analysis of process variations on single-walled carbon nanotube (SWCNT) bundles. Unlike previous works t...
This paper proposes a new methodology to model the distribution of finite size content to a group of users connected through an overlay network. Our methodology describes the distr...
A new algorithm is presented that combines performance and variation objectives in a behavioural model for a given analogue circuit topology and process. The tradeoffs between per...
Sawal Ali, Reuben Wilcock, Peter R. Wilson, Andrew...
The label switching problem is caused by the likelihood of a Bayesian mixture model being invariant to permutations of the labels. The permutation can change multiple times betwee...