Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
— Path planning algorithms that incorporate risk and uncertainty need to be able to predict the evolution of pathfollowing error statistics for each candidate plan. We present an...
In this paper we consider the capabilities of nearest neighbor as a criterion of data association to ensure correct decision in associating measurement to target. We continue the ...
This paper introduces a modular modeling approach for distributed production systems, considering production and maintenance processes synchronization. Thus, production job shop, p...
Daniel I. Racoceanu, Noureddine Zerhouni, Nawal Ad...
Recent increases in the density and size of memory ICs made it ne cessary to search for new defect tolerance techniques since the traditional methods are no longer e ective enough...