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ICCAD
2005
IEEE
106views Hardware» more  ICCAD 2005»
14 years 6 months ago
FPGA device and architecture evaluation considering process variations
Process variations in nanometer technologies are becoming an important issue for cutting-edge FPGAs with a multimillion gate capacity. Considering both die-to-die and withindie va...
Ho-Yan Wong, Lerong Cheng, Yan Lin, Lei He
ICRA
2009
IEEE
150views Robotics» more  ICRA 2009»
14 years 4 months ago
Analytic error variance predictions for planar vehicles
— Path planning algorithms that incorporate risk and uncertainty need to be able to predict the evolution of pathfollowing error statistics for each candidate plan. We present an...
Matthew Greytak, Franz Hover
JVA
2006
IEEE
14 years 3 months ago
Nearest Neighbour Criterion - Analitical Performance Evaluation
In this paper we consider the capabilities of nearest neighbor as a criterion of data association to ensure correct decision in associating measurement to target. We continue the ...
Ljudmil V. Bojilov
ICRA
2002
IEEE
121views Robotics» more  ICRA 2002»
14 years 2 months ago
Modular Modeling and Analysis of a Distributed Production System with Distant Specialised Maintenance
This paper introduces a modular modeling approach for distributed production systems, considering production and maintenance processes synchronization. Thus, production job shop, p...
Daniel I. Racoceanu, Noureddine Zerhouni, Nawal Ad...
DFT
1997
IEEE
141views VLSI» more  DFT 1997»
14 years 2 months ago
Analysis of a Hybrid Defect-Tolerance Scheme for High-Density Memory ICs
Recent increases in the density and size of memory ICs made it ne cessary to search for new defect tolerance techniques since the traditional methods are no longer e ective enough...
Israel Koren, Zahava Koren