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KAIS
2008
114views more  KAIS 2008»
13 years 10 months ago
A new concise representation of frequent itemsets using generators and a positive border
A complete set of frequent itemsets can get undesirably large due to redundancy when the minimum support threshold is low or when the database is dense. Several concise representat...
Guimei Liu, Jinyan Li, Limsoon Wong
BMCBI
2007
125views more  BMCBI 2007»
13 years 10 months ago
Identification of discriminative characteristics for clusters from biologic data with InforBIO software
Background: There are a number of different methods for generation of trees and algorithms for phylogenetic analysis in the study of bacterial taxonomy. Genotypic information, suc...
Naoto Tanaka, Masataka Uchino, Satoru Miyazaki, Hi...
ICCAD
1998
IEEE
116views Hardware» more  ICCAD 1998»
14 years 2 months ago
On primitive fault test generation in non-scan sequential circuits
A method is presented for identifying primitive path-delay faults in non-scan sequential circuits and generating robust tests for all robustly testable primitive faults. It uses t...
Ramesh C. Tekumalla, Premachandran R. Menon
ADBIS
1998
Springer
100views Database» more  ADBIS 1998»
14 years 2 months ago
Multiple Range Query Optimization in Spatial Databases
In order to answer efficiently range queries in 2-d R-trees, first we sort queries by means of a space filling curve, then we group them together, and finally pass them for process...
Apostolos Papadopoulos, Yannis Manolopoulos
EURODAC
1990
IEEE
92views VHDL» more  EURODAC 1990»
14 years 2 months ago
Accelerated test pattern generation by cone-oriented circuit partitioning
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...
Torsten Grüning, Udo Mahlstedt, Wilfried Daeh...