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DDECS
2007
IEEE
201views Hardware» more  DDECS 2007»
14 years 5 months ago
Built in Defect Prognosis for Embedded Memories
: As scan compression replaces the traditional scan it is important to understand how it works with power. DFT MAX represents one of the two primary scan compression solutions used...
Prashant Dubey, Akhil Garg, Sravan Kumar Bhaskaran...
VLSID
2006
IEEE
183views VLSI» more  VLSID 2006»
14 years 4 months ago
Design Challenges for High Performance Nano-Technology
This tutorial present the key aspects of design challenges and its solutions that are being experienced in VLSI design in the era of nano technology. The focus will be on design c...
Goutam Debnath, Paul J. Thadikaran
MTDT
2003
IEEE
100views Hardware» more  MTDT 2003»
14 years 4 months ago
Optimal Spare Utilization in Repairable and Reliable Memory Cores
Advances in System-on-Chip (SoC) technology rely on manufacturing and assembling high-performance system cores for many critical applications. Among these cores, memory occupies t...
Minsu Choi, Nohpill Park, Fabrizio Lombardi, Yong-...
IPPS
1999
IEEE
14 years 3 months ago
Hardwired-Clusters Partial-Crossbar: A Hierarchical Routing Architecture for Multi-FPGA Systems
Multi-FPGA systems (MFSs) are used as custom computing machines, logic emulators and rapid prototyping vehicles. A key aspect of these systems is their programmable routing archit...
Mohammed A. S. Khalid, Jonathan Rose
FPGA
1998
ACM
142views FPGA» more  FPGA 1998»
14 years 3 months ago
A Hybrid Complete-Graph Partial-Crossbar Routing Architecture for Multi-FPGA Systems
Multi-FPGA systems (MFSs) are used as custom computing machines, logic emulators and rapid prototyping vehicles. A key aspect of these systems is their programmable routing archit...
Mohammed A. S. Khalid, Jonathan Rose