234 search results - page 14 / 47 » Multiple Faults: Modeling, Simulation and Test |
EH
2005
IEEE
14 years 1 months ago
2005
IEEE
The hybrid redundancy structure found at the cellular level of higher animals provides complex organism with the three key features of a reliability-engineered system: fault toler...
EVOW
2001
Springer
14 years 9 days ago
2001
Springer
The integrated circuits design flow is rapidly moving towards higher description levels. However, test-related activities are lacking behind this trend, mainly since effective faul...
DATE
2007
IEEE
14 years 2 months ago
2007
IEEE
Multiple asynchronous clock domains have been increasingly employed in System-on-Chip (SoC) designs for different I/O interfaces. Functional validation is one of the most expensiv...
SRDS
1993
IEEE
13 years 12 months ago
1993
IEEE
We propose a simple and practical probabilistic comparison-based model, employing multiple incomplete test concepts, for handling fault location in distributed systems using a Bay...
ET
2007
13 years 7 months ago
2007
In this paper, we focus on reliability, one of the most fundamental and important challenges, in the nanoelectronics environment. For a processor architecture based on the unreliab...