234 search results - page 18 / 47 » Multiple Faults: Modeling, Simulation and Test |
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
IJNM
2000
13 years 7 months ago
2000
The complexity of communication networks and the amount of information transferred in these networks have made the management of such networks increasingly difficult. Since faults ...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
TNN
2010
13 years 2 months ago
2010
The weight-decay technique is an effective approach to handle overfitting and weight fault. For fault-free networks, without an appropriate value of decay parameter, the trained ne...
ISQED
2007
IEEE
14 years 2 months ago
2007
IEEE
Soft error due to ionizing radiation is emerging as a major concern for future technologies. The measurement unit for failures due to soft errors is called Failure-In-Time (FIT) t...