234 search results - page 31 / 47 » Multiple Faults: Modeling, Simulation and Test |
ASPDAC
2006
ACM
2006
ACM
Equivalent circuit modeling of guard ring structures for evaluation of substrate crosstalk isolation
14 years 1 months ago
— A substrate-coupling equivalent circuit can be derived for an arbitrary guard ring test structure by way of F-matrix computation. The derived netlist represents a unified impe...
HPCA
2006
IEEE
14 years 8 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
KBSE
2007
IEEE
14 years 2 months ago
2007
IEEE
Software compatibility testing is an important quality assurance task aimed at ensuring that component-based software systems build and/or execute properly across a broad range of...
ICCAD
2005
IEEE
14 years 4 months ago
2005
IEEE
The presence of unknown values in the simulation result is a key barrier to effective output response compaction in practice. This paper proposes a simple circuit module, called a...